AEM study of CVD low-carbon boron carbide phases
نویسندگان
چکیده
منابع مشابه
CVD Chemistry of Organoborons for Boron-Carbon Thin Film Depositions
................................................................................................................................................ iii Populärvetenskaplig Sammanfattning ................................................................................................ v Preface .............................................................................................................
متن کاملPlasma CVD of hydrogenated boron-carbon thin films from triethylboron.
Low-temperature chemical vapor deposition (CVD) of B-C thin films is of importance for neutron voltaics and semiconductor technology. The highly reactive trialkylboranes, with alkyl groups of 1-4 carbon atoms, are a class of precursors that have been less explored for low-temperature CVD of B-C films. Herein, we demonstrate plasma CVD of B-C thin films using triethylboron (TEB) as a single sour...
متن کاملLow Temperature CVD of Thin, Amorphous Boron-Carbon Films for Neutron Detectors
Thin, amorphous boron-carbon films were deposited at low temperature (400-600 °C) by thermally activated CVD using the organoborane triethylboron (TEB) as a single precursor. Two different carrier gases were tested. At 600 °C using argon as carrier gas the deposition rate was close to 1 μm/h. The film had a density of 2.14 g/cm with a B/C-ratio of 3.7. When hydrogen was used as carrier gas the ...
متن کاملEquilibrium analysis of zirconium carbide CVD growth
A chemical equilibrium study was performed to investigate the effect of growth parameters on the constitution in ZrC films grown by chemical vapor deposition (CVD). The equilibrium analysis of the Zr–C–H system demonstrated that ZrC (fcc) deposition is favorable and that a certain minimum amount of hydrogen should prevent co-deposition of elemental carbon over a wide range of temperature, press...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 1987
ISSN: 0108-7673
DOI: 10.1107/s0108767387081856